Among the many kinds of networking technologies, the wireless ad hoc network is an important one for creating\nhigh-performance ubiquitous computing systems. The availability of a wireless ad hoc network (WANET) depends\nhighly upon the level of node reliability. System-level fault diagnosis has long been a subject for the purpose of\nmaintaining system reliability. This paper addresses the comparison-based approach to fault detection, and\naccordingly, we developed a localized algorithm for detecting faulty nodes in strongly one-step t-diagnosable\nWANETs. The contributions of this paper are highlighted as follows: (i) A localized fault detection algorithm is proposed\nfor strongly one-step t-diagnosable WANETs under the comparison model, (ii) the proposed algorithm is formally\nproved, and it incurs only linear time complexity, which is relatively efficient compared to some others in literature,\nand (iii) some examples are presented for clarifying how to accomplish the comparison-based fault detection process.
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